Abstract

Uncovering the electronic structure dynamics of materials is essential both for the development of sophisticated devices as well as for fundamental physics understanding. In particular, optoelectronic devices operate under non-equilibrium conditions, where excited charge carriers cause changes in the electronic structure and lattice properties, and thus of optical properties, affecting their performance. Femtosecond time-resolved pump-probe ellipsometry or time domain ellipsometry are powerful tools to measures the transient complex dielectric function after excitation of charge carriers, providing vast knowledge about the electronic structure and spin dynamics of materials. 

Over the past decade this technique has matured and been applied to semiconductors, transition-metal dichalcogenides, correlated oxides, and organic materials. It has revealed hot carrier cooling, photoinduced phase transitions, ultrafast magneto-optical resonances, and interfacial charge transfer at solid–liquid boundaries, amongst other effects. 

This mini-colloquium will survey the state of the art in broadband implementations, imaging modalities, and analysis workflows, including models that connect Δε̃(ω,t) to microscopic processes. We will highlight results, discuss best practices, and map emerging directions. The goal is to consolidate a community across materials classes and define open challenges where time-resolved ellipsometry deliver unique insight.

Invited speakers

to be announced

Organizers